The test loss of well-trained neural networks often follows precise power-law scaling relations with either the size of the training dataset or the number of parameters in the network. We propose a theory that explains and connects these scaling laws. We identify variance-limited and resolution-limited scaling behavior for both dataset and model size, for a total of four scaling regimes. The variance-limited scaling follows simply from the existence of a well-behaved infinite data or infinite width limit, while the resolution-limited regime can be explained by positing that models are effectively resolving a smooth data manifold. In the large width limit, this can be equivalently obtained from the spectrum of certain kernels, and we present evidence that large width and large dataset resolution-limited scaling exponents are related by a duality. We exhibit all four scaling regimes in the controlled setting of large random feature and pretrained models and test the predictions empirically on a range of standard architectures and datasets. We also observe several empirical relationships between datasets and scaling exponents: super-classing image tasks does not change exponents, while changing input distribution (via changing datasets or adding noise) has a strong effect. We further explore the effect of architecture aspect ratio on scaling exponents.

该研究提出了一种理论，解释并连接训练数据集大小和网络参数数量与已训练神经网络的测试损失之间的精确定义的幂律关系，并通过说明数据流形和一些核的频谱之间的等效性来解释了分辨率有限的缩放行为。

神经缩放定律解释