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Apr, 2023
FakET:利用神经风格迁移模拟冷冻电子层析图
FakET: Simulating Cryo-Electron Tomograms with Neural Style Transfer
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Pavol Harar, Lukas Herrmann, Philipp Grohs, David Haselbach
TL;DR
本文提出一种基于加性噪声和神经风格迁移技术的电子显微镜前向算子模拟方法,加速了数据生成过程,同时利用 GPU 加速和并行处理,可作为数据增强技术或单独使用以适应数据集,其在粒子定位和分类任务上的表现与基准相当,并且需要的训练数据集要少 33 倍。
Abstract
Particle localization and -classification constitute two of the most fundamental problems in
computational microscopy
. In recent years,
deep learning
based approaches have been introduced for these tasks with gre
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