TL;DR研究了少样本分类任务中的弱特征表示问题,提出了一种新的Clustered-patch Element Connection(CEC)层来解决这个问题,并使用CECNet在分类基准上取得了最先进的性能。
Abstract
Weak feature representation problem has influenced the performance of few-shot classification task for a long time. To alleviate this problem, recent researchers build connections between →