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Apr, 2023
SREL:基于S参数模式的铜互连非破坏故障诊断的严重性评级集成学习
SREL: Severity Rating Ensemble Learning for Non-Destructive Fault Diagnosis of Cu Interconnects using S-parameter Patterns
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Tae Yeob Kang, Haebom Lee, Sungho Suh
TL;DR
本文研究了电路中的互连对电子系统的可靠性和性能的影响,提出了一种新的方法来诊断互连的缺陷,该方法采用 S-parameter 模式实现了早期检测,高精度的诊断和噪声鲁棒性。
Abstract
As operating frequencies and clock speeds in processors have increased over the years,
interconnects
affect both the reliability and performance of entire electronic systems. Fault detection and diagnosis of the
interco
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