In this work, we give a novel general approach for distribution testing. We
describe two techniques: our first technique gives sample-optimal testers,
while our second technique gives matching sample lower bounds. As a
consequence, we resolve the sample complexity of a wide variety of testing
problems.
Our upper bounds are obtained via a modular reduction-based approach. Our
approach yields optimal testers for numerous problems by using a standard
$\ell_2$-identity tester as a black-box. Using this recipe, we obtain simple
estimators for a wide range of problems, encompassing most problems previously
studied in the TCS literature, namely: (1) identity testing to a fixed
distribution, (2) closeness testing between two unknown distributions (with
equal/unequal sample sizes), (3) independence testing (in any number of
dimensions), (4) closeness testing for collections of distributions, and (5)
testing histograms. For all of these problems, our testers are sample-optimal,
up to constant factors. With the exception of (1), ours are the {\em first
sample-optimal testers for the corresponding problems.} Moreover, our
estimators are significantly simpler to state and analyze compared to previous
results.
As an application of our reduction-based technique, we obtain the first {\em
nearly instance-optimal} algorithm for testing equivalence between two {\em
unknown} distributions. Moreover, our technique naturally generalizes to other
metrics beyond the $\ell_1$-distance.
Our lower bounds are obtained via a direct information-theoretic approach:
Given a candidate hard instance, our proof proceeds by bounding the mutual
information between appropriate random variables. While this is a classical
method in information theory, prior to our work, it had not been used in
distribution property testing.

研究了分布检测的样本测试的复杂度问题，提出了两种技术方法，一种是提供样本最优测试器，另一种是提供匹配样本下界。作者解决了大量重要的测试问题并证明了样本最优性，并且得到了第一个样本最优的对应测试器。