In contemporary times, the increasing complexity of the system poses
significant challenges to the reliability, trustworthiness, and security of the
SACRES. Key issues include the susceptibility to phenomena such as
instantaneous voltage spikes, electromagnetic interference, neutron strikes,
and out-of-range temperatures. These factors can induce switch state changes in
transistors, resulting in bit-flipping, soft errors, and transient corruption
of stored data in memory. The occurrence of soft errors, in turn, may lead to
system faults that can propel the system into a hazardous state. Particularly
in critical sectors like automotive, avionics, or aerospace, such malfunctions
can have real-world implications, potentially causing harm to individuals.
This paper introduces a novel fault injector designed to facilitate the
monitoring, aggregation, and examination of micro-architectural events. This is
achieved by harnessing the microprocessor's PMU and the debugging interface,
specifically focusing on ensuring the repeatability of fault injections. The
fault injection methodology targets bit-flipping within the memory system,
affecting CPU registers and RAM. The outcomes of these fault injections enable
a thorough analysis of the impact of soft errors and establish a robust
correlation between the identified faults and the essential timing
predictability demanded by SACRES.

本文介绍了一种用于监测、聚合和检查微架构事件的新型故障注入器，通过利用微处理器的 PMU 和调试接口，重点确保故障注入的重复性，与 SACRES 所需的关键时间可预测性之间建立了强大的相关性，从而实现对软错误的影响的全面分析。