Jul, 2023
TEM 图像中晶体缺陷的深度学习:解决 “训练数据永远不够” 的问题
Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data"
Kishan Govind, Daniela Oliveros, Antonin Dlouhy, Marc Legros, Stefan Sandfeld
TL;DR本研究提出了用于分割位错的合成训练数据的参数模型,并开发了一种优化分割重叠或相交位错线的深度学习方法,该方法在多种微结构和成像条件下都表现出高效性和优越性。